Characterization & Imaging

Diffractometer for thin films, single crystals and powders from room temperature up to 900°C using CuKα radiations. (LEFT: The PANalytical X’Pert Pro Materials Research X-ray Diffractometer)...
X-ray photoelectron spectroscopy (XPS), also referred to as electron spectroscopy for chemical analysis (ESCA), is a sensitive technique for investigating the elemental composition and the...
Our new JEOL JXA-8530F Hyperprobe features a field emission electron gun and a wavelength dispersive X-ray spectrometer (WDS). The FE electron gun produces an extremely small spot size at low voltage...
The XL30 ESEM-FEG offers high resolution secondary electron imaging at pressures as high as 10 Torr and sample temperatures as high as 1,000°C. This means that wet, oily, dirty, outgassing, and non-...
The FEI Titan ETEM is built around a 80-300 kV electron column and enables sub-Angstrom, atomic scale discovery and exploration in both TEM and STEM modes over a wide range of materials and...
The Nion UltraSTEMTM 100 is an aberration corrected STEM that offers sub-angstrom resolution at both 100 keV and 60 keV.  A special monochromater newly developed for ASU offers ultra-fast ELLS...
The 2010 F is equipped with thin-window light-element-sensitive X-ray detector and a Gatan Enfina energy-loss spectrometer for high spatial resolution microanalysis. The microscope can be operated...
The ARM200F is an aberration corrected STEM equipped with both an x-ray spectrometer and a special, newly developed electron spectrometer, with ultra-fast EELS that allows atomic level mapping....
Profilometry is a technique used to determine the topography of a surface and in some case measure stop height to determine film thickness. The vertical resolution is comparable to that of an AFM...
The Nova NanoLab brings advanced capabilities and flexibility to researchers and developers needing to create, modify, and characterize complex structures below 100 nanometers. It combines ultra-...
X-ray topography (XRT) is a diffraction method used to map lattice defects and strain in single crystals, typically wafers, on the micrometer level. XRT is a simple and non destructive method....
  Our micro-Raman spectrometer uses a 532nm laser to measure the sample. The information provided by Raman spectra are similar to that provided by FT-IR and result from an interaction...

LeRoy Eyring Center for Solid State Science

Arizona State University's LeRoy Eyring Center supports academic research and industrial R&D with advanced capabilities for materials characterization, analysis and high resolution microscopy.  Our expert staff is committed to active user engagement.  We have provided users with open access and instrument training since 1974.